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Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.00 vteřin. 
Tolerances and Misalignment Aberrations for Electron Optical Elements and Systems
 Sháněl, Ondřej ; Radlička, Tomáš (oponent) ; Tiemeijer,, Peter Christiaan (oponent) ; Zlámal, Jakub (vedoucí práce)
Inaccuracies in the production and assembling of rotationally symmetric lenses and deflectors and their accurate positioning in the electron optical system can be treated as an additional field with specific type of symmetry. The additional fields can be evaluated with the help of the finite element method in the program EOD. Tolerance analysis allows evaluation of the requirements on the dimensions and position of individual elements and their parts. Elimination of misalignment aberrations consists in determining the type and position of correcting deflection coils and multipoles so that these additional aberrations are removed or their effect is minimized. The aim of the dissertation is the analysis of the effect of misalignment aberrations and behavior of misaligned systems of transmission electron microscopes.
Úplný záznam
Tolerances and Misalignment Aberrations for Electron Optical Elements and Systems
 Sháněl, Ondřej ; Radlička, Tomáš (oponent) ; Tiemeijer,, Peter Christiaan (oponent) ; Zlámal, Jakub (vedoucí práce)
Inaccuracies in the production and assembling of rotationally symmetric lenses and deflectors and their accurate positioning in the electron optical system can be treated as an additional field with specific type of symmetry. The additional fields can be evaluated with the help of the finite element method in the program EOD. Tolerance analysis allows evaluation of the requirements on the dimensions and position of individual elements and their parts. Elimination of misalignment aberrations consists in determining the type and position of correcting deflection coils and multipoles so that these additional aberrations are removed or their effect is minimized. The aim of the dissertation is the analysis of the effect of misalignment aberrations and behavior of misaligned systems of transmission electron microscopes.
Úplný záznam

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